Conductive Atomic Force Microscopy
Engels
384

The first book to summarize the applications of CAFM as the most important method in the study of electronic properties of materials and devices at the nanoscale.

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  • : 9783527340910
  • : Engels
  • : Hardcover
  • : 384
  • : oktober 2017
  • : 978
  • : 176 x 251 x 25 mm.
  • : Nanotechnologie; Techniek: algemeen; Toegepaste optica; Werktuigbouwkunde en werktuigbouwkundige materialen